Report on results of cell and stack tests

The report will contain a comparison of of performance and durability of SoA components (cells and stacks) with op-timised ones which are developed within the WP3. Long-term testing will include the measurement of voltage-current data, degradation rates, and cell/stack impedance, if available. Impedance spectroscopy allows the identification of the causes of degradation. This can orient the cell and stack developers for component improvements, in order to achieve 1 %/1000 h stack-voltage degradation. In addition, the influence of thermal management on stack degradation will be analysed by the tests results in a furnace done by EIFER and in a thermally self-sustaining environment done by SF.