Bulk and surface recombination properties in thin film semiconductors with different surface treatments from time-resolved photoluminescence measurements

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Authors: Thomas P. Weiss, Benjamin Bissig, Thomas Feurer, Romain Carron, Stephan Buecheler, Ayodhya N. Tiwari

Journal title: Scientific Reports

Journal number: 9/1

Journal publisher: Nature Publishing Group

Published year: 2019

Published pages: 5385

DOI identifier: 10.1038/s41598-019-41716-x

ISSN: 2045-2322