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Authors: A. Mori, P. di Bartolomeo, M. Bandinelli, A. Bonsignore, N. Muot, C. Girard, G. Prin, J. P. Parmantier, I. Junqua, S. Bertuol, J. Morio, G. Antonini, M. D. Astorino, C. Jullien
Journal title: 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE
Journal publisher: IEEE
Published year: 2020
Published pages: 1-6
DOI identifier: 10.1109/emceurope48519.2020.9245716
ISBN: 978-1-7281-5579-1
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