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Authors: Aleksandar Hudic, Matthias Flittner, Thomas Lorunser, Philipp M. Radl, Roland Bless
Journal title: 2016 11th International Conference on Availability, Reliability and Security (ARES)
Journal publisher: IEEE
Published year: 2016
Published pages: 428-436
DOI identifier: 10.1109/ARES.2016.73
ISBN: 978-1-5090-0990-9
