Deep Statistical Analysis of OCR Errors for Effective Post-OCR Processing

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Authors: Nguyen, Thi-Tuyet-Hai; Jatowt, Adam; Coustaty, Mickael; Nguyen, Nhu-Van; Doucet, Antoine

Journal title: 2019 JOINT CONFERENCE ON DIGITAL LIBRARIES (JCDL), Urbana-Champaign, Illinois, June 2-6, 2019

Journal number: yearly

Journal publisher: IEEE computer society

Published year: 2019

Published pages: 29-38

DOI identifier: 10.1109/jcdl.2019.00015

ISBN: 978-1-7281-1547-4