Structural and Insulating Behaviour of High-Permittivity Binary Oxide Thin Films for Silicon Carbide and Gallium Nitride Electronic Devices

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Authors: R. Lo Nigro, P. Fiorenza, G. Greco, E. Schilirò, F. Roccaforte

Journal title: Materials

Journal number: 15

Journal publisher: MDPI Open Access Publishing

Published year: 2022

Published pages: 830

DOI identifier: 10.3390/ma15030830

ISSN: 1996-1944