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Authors: J. He, F. Jiang, K. Keykhosravi, J. Kokkoniemi, H. Wymeersch, and M. Juntti
Journal title: IEEE Access
Journal number: N/A
Journal publisher: Institute of Electrical and Electronics Engineers Inc.
Published year: 2022
Published pages: 68075 - 68084
DOI identifier: 10.1109/access.2022.3186510
ISSN: 2169-3536