Summary
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Authors: J. Büchel, A. Vasilopoulos, B. Kersting, F. Odermatt, K. Brew, I. Ok, S. Choi, I. Saraf, V. Chan, T. Philip, N. Saulnier, V. Narayanan, M. Le Gallo, A. Sebastian
Journal title: 2022 International Electron Devices Meeting (IEDM)
Journal publisher: IEEE
Published year: 2023
DOI identifier: 10.48550/arXiv.2305.16647
ISSN: 2156-017X