Charge Trap States of SiC Power TrenchMOS Transistor under Repetitive Unclamped Inductive Switching Stress

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Authors: Marek, J.; Kozarik, J.; Minarik, M.; Chvála, A.; Matus, M.; Donoval, M.; Stuchlikova, L.; Weis, M.

Journal title: Materials

Journal number: 15, no. 22

Journal publisher: MDPI Open Access Publishing

Published year: 2022

Published pages: 8230

DOI identifier: 10.3390/ma15228230

ISSN: 1996-1944