Implementation of onsite Junction Temperature Estimation for a SiC MOSFET Module for Condition Monitoring

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Authors: Hosseinabadi, F., Jaman, S., Bhoi, S. K., Hasan, M. M., Chakraborty, S., El Baghdadi, M., & Hegazy, O.

Journal title: 24th European Conference on Power Electronics and Applications (EPE'22 ECCE Europe)

Journal number: 05-09 September 2022

Journal publisher: IEEE

Published year: 2022

ISBN: 978-1-6654-8700-9