Electrical Performance Degradation of SiC Power TrenchMOS Transistor Under Repetitive UIS Stress

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Authors: Juraj Marek, Jozef Kozárik, Michal Minárik, Aleš Chvála, Matej Matúš and Ľ. Stuchlíková

Journal title: ICSCRM 2022

Journal publisher: ICSCRM 2022

Published year: 2022