Modeling and Simulation of Time Domain Reflectometry Signals on a Real Network for Use in Fault Classification and Location

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Authors: Javier Granado Fornás; Elías Herrero Jaraba; Hans Bludszuweit; David Cervero García; Andrés Llombart Estopiñan

Journal title: IEEE Access

Journal number: 22813510

Journal publisher: Institute of Electrical and Electronics Engineers Inc.

Published year: 2023

Published pages: 23596 - 23619

DOI identifier: 10.1109/access.2023.3253772

ISSN: 2169-3536