Investigating the impact of short-circuit faults in different neutral configurations: a real case study

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Authors: Marco Antonio Bucarelli, Dimitri Agostini, Alberto Geri, Fabio Massimo Gatta, Marco Maccioni, Marco Paulucci

Journal title: 115th edition AEIT 2023 International Annual Conference (AEIT 2023)

Journal publisher: IEEE

Published year: 2023