In-situ Electrical Transport Measurements Combined with Scanning Transmission X-ray Microscopy

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Authors: S. Finizio, K. Zeissler, G. Burnell, C.H. Marrows, J. Raabe

Journal title: Microscopy and Microanalysis

Journal number: 24/S2

Journal publisher: Cambridge University Press

Published year: 2018

Published pages: 78-79

DOI identifier: 10.1017/S1431927618012771

ISSN: 1431-9276