Report on characterization of GaAs/Ge/Si micro-crystals

Summary
Report on the characterization of GaAsAlGaAs quantum nanostructures deposited on Ge microcrystals The characterization technique will include high resolution XRD transmission electron microscopy TEM photoluminescence and Raman spectroscopy
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Web resources: https://ec.europa.eu/research/participants/documents/downloadPublic?documentIds=080166e5e2737b39&appId=PPGMS
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