Composition determination of semiconductor alloys towards atomic accuracy by HAADF-STEM

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Authors: L. Duschek, P. Kükelhan, A. Beyer, S. Firoozabadi, J.O. Oelerich, C. Fuchs, W. Stolz, A. Ballabio, G. Isella, K. Volz

Journal title: Ultramicroscopy

Journal number: 200

Journal publisher: Elsevier BV

Published year: 2019

Published pages: 84-96

DOI identifier: 10.1016/j.ultramic.2019.02.009

ISSN: 0304-3991