Report on the characterization of Ge micro-crystals

Summary
RReport on the characterization of Ge micro-crystals deposited on patterned Si substrates. The characterization technique will include: high resolution XRD, transmission electron microscopy (TEM), photoluminescence and Raman.
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Web resources: https://ec.europa.eu/research/participants/documents/downloadPublic?documentIds=080166e5c8bd0450&appId=PPGMS
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