Report on the characterization of Si micro-crystals

Summary
Report on the characterization of Si micro-crystals deposited on patterned substrates. The characterization technique will include transmission electron microscopy (TEM), photoluminescence and Raman spectroscopy.
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Web resources: https://ec.europa.eu/research/participants/documents/downloadPublic?documentIds=080166e5c05809e9&appId=PPGMS
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