Composition determination for quaternary III-V semiconductors by aberration-corrected STEM

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Authors: P. Kükelhan; Andreas Beyer; Saleh Firoozabadi; T. Hepp; Kerstin Volz

Journal title: Ultramicroscopy

Journal number: 206

Journal publisher: Elsevier BV

Published year: 2019

Published pages: 112814

DOI identifier: 10.1016/j.ultramic.2019.112814

ISSN: 0304-3991