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Authors: Koos, C., Randel, S., Freude, W., Zwick, T., Scheytt, J.C., Witzens, J., Walther, M., Harter, T., Kieninger, C., Ummethala, S., Zwickel, H., Marin-Palomo, P., Muehlbrandt, S., Füllner, C., Schaefer, J., Gudyriev, S., Zazzi, A., Müller, J., Tessmann, A.
Journal publisher: IEEE
Published year: 2020
DOI identifier: 10.1109/bcicts48439.2020.9392969