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Authors: Maier, P. Chen, Y. Xu, Y. Bao, Y. Blaicher, M. Geskus, D. Dekker, R. Liu, J. Dietrich, P.-I. Peng, H. Randel, S. Freude, W. Kippenberg, T. J. Koos, C.
Journal title: Journal of Lightwave Technology
Journal publisher: IEEE
Published year: 2023
Published pages: 3479-3490
DOI identifier: 10.1109/jlt.2023.3243471