Optical Arbitrary Waveform Measurement (OAWM) on the Silicon Photonic Platform

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Authors: Fang, D.; Zazzi, A.; Mueller, J.; Drayss, D.; Fuellner, C.; Marin-Palomo, P.; Mashayekh, A. T.; Das, A. D.; Weizel, M.; Gudyriev, S.; Freude, W.; Randel, S.; Scheytt, J. C.; Witzens, J.; Koos, C.

Journal publisher: OFC 2021

Published year: 2021

DOI identifier: 10.1364/ofc.2021.f2e.6