Temperature dependence of strain–phonon coefficient in epitaxial Ge/Si(001): A comprehensive analysis

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Authors: C.L. Manganelli, M. Virgilio, O. Skibitzki, M. Salvalaglio, D. Spirito, P. Zaumseil, Y. Yamamoto, M. Montanari, W.M. Klesse, G. Capellini

Journal title: Journal of Raman Spectroscopy

Journal publisher: John Wiley & Sons Inc.

Published year: 2020

DOI identifier: 10.1002/jrs.5860

ISSN: 0377-0486