Insights into image contrast from dislocations in ADF-STEM

Summary

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Authors: E. Oveisi, M.C. Spadaro, E. Rotunno, V. Grillo, C. Hébert

Journal title: Ultramicroscopy

Journal number: 200

Journal publisher: Elsevier BV

Published year: 2019

Published pages: 139-148

DOI identifier: 10.1016/j.ultramic.2019.02.004

ISSN: 0304-3991