Segmented ion-trap fabrication using high precision stacked wafers

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Authors: Simon Ragg, Chiara Decaroli, Thomas Lutz, Jonathan P. Home

Journal title: Review of Scientific Instruments

Journal number: 90/10

Journal publisher: American Institute of Physics

Published year: 2019

Published pages: 103203

DOI identifier: 10.1063/1.5119785

ISSN: 0034-6748