Low-Frequency Noise Parameter Extraction Method for Single-Layer Graphene FETs

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Authors: Nikolaos Mavredakis, Wei Wei, Emiliano Pallecchi, Dominique Vignaud, Henri Happy, Ramon Garcia Cortadella, Nathan Schaefer, Andrea Bonaccini Calia, Jose Antonio Garrido, David Jimenez

Journal title: IEEE Transactions on Electron Devices

Journal number: 67/5

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2020

Published pages: 2093-2099

DOI identifier: 10.1109/ted.2020.2978215

ISSN: 0018-9383