Polymer-encapsulated molecular doped epigraphene for quantum resistance metrology

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Authors: Hans He, Samuel Lara-Avila, Kyung Ho Kim, Nick Fletcher, Sergiy Rozhko, Tobias Bergsten, Gunnar Eklund, Karin Cedergren, Rositsa Yakimova, Yung Woo Park, Alexander Tzalenchuk, Sergey Kubatkin

Journal title: Metrologia

Journal number: 56/4

Journal publisher: Institute of Physics Publishing

Published year: 2019

Published pages: 045004

DOI identifier: 10.1088/1681-7575/ab2807

ISSN: 0026-1394