Formation of Defects in Two-Dimensional MoS 2 in the Transmission Electron Microscope at Electron Energies below the Knock-on Threshold: The Role of Electronic Excitations

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Authors: Silvan Kretschmer, Tibor Lehnert, Ute Kaiser, Arkady V. Krasheninnikov

Journal title: Nano Letters

Journal number: 20/4

Journal publisher: American Chemical Society

Published year: 2020

Published pages: 2865-2870

DOI identifier: 10.1021/acs.nanolett.0c00670

ISSN: 1530-6984