MIRC-X/CHARA: sensitivity improvements with an ultra-low noise SAPHIRA detector

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Authors: Narsireddy Anugu, John D. Monnier, Stefan Kraus, Jacob Ennis, Benjamin Setterholm, Jean-Baptiste Le Bouquin, Cyprien Lanthermann, Claire Davies, Theo ten Brummelaar, Mariam Haidar, Veronika Dubravec, Scott Peters

Journal title: Optical and Infrared Interferometry and Imaging VI

Journal number: 1070124

Journal publisher: SPIE

Published year: 2018

Published pages: 58

DOI identifier: 10.1117/12.2313036

ISBN: 9781-510619562