Phase retrieval from 4-dimensional electron diffraction datasets

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Authors: Friedrich, Thomas; Yu, Chu-Ping; Verbeek, Johan; Pennycook, Timothy; Van Aert, Sandra

Journal title: IEEE International Conference on Image Processing (ICIP), SEP 19-22, 2021, Electr. network

Journal publisher: IEEE

Published year: 2021

Published pages: 3453-3457

DOI identifier: 10.1109/icip42928.2021.9506709

ISBN: 978-1-6654-4115-5