Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors

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Authors: Sentürk, D.G.; De Backer, A.; Friedrich, T.; Van Aert, S.

Journal title: Ultramicroscopy

Journal number: 03043991

Journal publisher: Elsevier BV

Published year: 2022

Published pages: 113626

DOI identifier: 10.1016/j.ultramic.2022.113626

ISSN: 0304-3991