Three approaches for representing the statistical uncertainty on atom-counting results in quantitative ADF STEM

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Authors: De wael, A.; De Backer, A.; Yu, C.-P.; Sentürk, D.G.; Lobato, I.; Faes, C.; Van Aert, S.

Journal title: Microscopy and microanalysis

Journal number: 14319276

Journal publisher: Cambridge University Press

Published year: 2022

Published pages: 1-9

DOI identifier: 10.1017/s1431927622012284

ISSN: 1431-9276