Noise2Atom: unsupervised denoising for scanning transmission electron microscopy images

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Authors: Feng Wang, Trond R. Henninen, Debora Keller, Rolf Erni

Journal title: Applied Microscopy

Journal number: 50/1

Journal publisher: Springer

Published year: 2020

Published pages: 1-9

DOI identifier: 10.1186/s42649-020-00041-8

ISSN: 2287-4445