Assessing the Quality of Low-Code and Model-Driven Engineering Platforms for Engineering IoT Systems

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Authors: Felicien Ihirwe Davide Di Ruscio Simone Gianfranceschi Alfonso Pierantonio

Journal title: 2022 IEEE 22nd International Conference on Software Quality, Reliability and Security (QRS)

Journal number: yearly

Journal publisher: IEEE

Published year: 2022

Published pages: 583-594

DOI identifier: 10.1109/qrs57517.2022.00065