Summary
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Authors: Giuseppe Stragapede, Ruben Vera-Rodriguez, Ruben Tolosana, Aythami Morales, Alejandro Acien, Gael Le Lan
Journal title: 2022 International Workshop on Biometrics and Forensics (IWBF)
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.1109/iwbf55382.2022.9794524
ISBN: 978-1-6654-6962-3
