Summary
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Authors: Amina Bassit, Florian Hahn, Chris Zeinstra, Raymond Veldhuis, Andreas Peter
Journal title: 2021 International Conference of the Biometrics Special Interest Group (BIOSIG)
Journal publisher: IEEE
Published year: 2021
Published pages: 1-6
DOI identifier: 10.1109/biosig52210.2021.9548304
ISBN: 978-1-6654-2693-0
