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Authors: Roberto Leyva, Victor Sanchez, Chang-Tsun Li
Journal title: 2017 5th International Workshop on Biometrics and Forensics (IWBF)
Journal publisher: IEEE
Published year: 2017
Published pages: 1-6
DOI identifier: 10.1109/iwbf.2017.7935096
ISBN: 978-1-5090-5791-7