A Novel Hierarchical Tree-DCNN Structure for Unbalanced Data Diagnosis in Microelectronic Manufacturing Process

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Yong Zeng, Yanfang Mei, Yueming Hu, Zhengguo Sheng

Journal title: IEEE Transactions on Instrumentation and Measurement

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2023

DOI identifier: 10.1109/tim.2023.3338692

ISSN: 0018-9456