Measuring Linkability of Protected Biometric Templates Using Maximal Leakage

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Authors: Hatef Otroshi Shahreza; Yanina Y. Shkel; Sébastien Marcel

Journal title: Crossref

Journal number: 2

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2023

DOI identifier: 10.1109/tifs.2023.3266170

ISSN: 1556-6013