Attacking Face Recognition With T-Shirts: Database, Vulnerability Assessment, and Detection

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Mathias Ibsen; Christian Rathgeb; Fabian Brechtel; Ruben Klepp; Katrin Pöppelmann; Anjith George; Sébastien Marcel; Christoph Busch

Journal title: IEEE Access

Journal number: 59

Journal publisher: Institute of Electrical and Electronics Engineers Inc.

Published year: 2023

DOI identifier: 10.1109/access.2023.3282780

ISSN: 2169-3536