Summary
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Authors: Denis Kleyko, Mike Davies, E. Paxon Frady, Pentti Kanerva, Spencer J. Kent, Bruno A. Olshausen, Evgeny Osipov, Jan M. Rabaey, Dmitri A. Rachkovskij, Abbas Rahimi, Friedrich T. Sommer
Journal title: Proceedings of the IEEE
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2022
Published pages: 1538-1571
DOI identifier: 10.1109/jproc.2022.3209104
ISSN: 0018-9219