Fast & Accurate Methodology for Aging Incorporation in Circuits using Adaptive Waveform Splitting (AWS)

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Authors: S. Mishra, P. Weckx, J. Y. Lin, B. Kaczer, D. Linten, A. Spessot, F. Catthoor

Journal title: 2020 IEEE International Reliability Physics Symposium (IRPS)

Journal publisher: IEEE

Published year: 2020

Published pages: 1-5

DOI identifier: 10.1109/irps45951.2020.9129351

ISBN: 978-1-7281-3199-3