Overhead Reduction with Optimal Margining Using A Reliability Aware Design Paradigm

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Authors: S. Mishra, P. Weckx, O. Zografos, J. Y. Lin, A. Spessot, F. Catthoor

Journal title: 2021 IEEE International Reliability Physics Symposium (IRPS)

Journal publisher: IEEE

Published year: 2021

Published pages: 1-7

DOI identifier: 10.1109/IRPS46558.2021.9405198

ISBN: 978-1-7281-6893-7