Physics-based Modeling of Hot-Carrier Degradation in Ge NWFETs

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Authors: S. E. Tyaginov, A. Chasin, A. Makarov, A.-M. El-Sayed, M. Jech, A. De Keersgieter, G. Eneman, M. Vandemaele, J. Franco, D. Linten, B. Kaczer

Journal title: Proc. International Conference on Solid State Devices and Materials (SSDM-2019)

Journal publisher: Japan Society of Applied Physics

Published year: 2019

Published pages: pp. 565 - 566