Ab initio treatment of silicon-hydrogen bond rupture at Si/SiO2 interfaces

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Authors: M. Jech, A.-M. El-Sayed, S. Tyaginov, A. L. Shluger, T. Grasser

Journal title: Physical Review B. v. 100, No. 19, p. 195302 (2019)

Journal publisher: APS

Published year: 2019

DOI identifier: 10.1103/physrevb.100.195302

ISSN: 2469-9950