Bi-Modal Variability of nFinFET Characteristics During Hot-Carrier Stress: A Modeling Approach

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Authors: Alexander Makarov, Ben Kaczer, Adrian Chasin, Michiel Vandemaele, Erik Bury, Markus Jech, Alexander Grill, Geert Hellings, Al-Moatasem El-Sayed, Tibor Grasser, Dimitri Linten, Stanislav Tyaginov

Journal title: IEEE Electron Device Letters

Journal number: 40/10

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2019

Published pages: 1579-1582

DOI identifier: 10.1109/led.2019.2933729

ISSN: 0741-3106