Impact of Mixed Negative Bias Temperature Instability and Hot Carrier Stress on MOSFET Characteristics-Part II: Theory

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: M. Jech, B. Ullmann, G. Rzepa, S. E. Tyaginov, A. Grill, M. Waltl, D. Jabs, C. Jungemann, T. Grasser

Journal title: IEEE Transactions on Electron Devices, v. 66, No. 1, pp. 241-248 (2019)

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2019

DOI identifier: 10.1109/ted.2018.2873421

ISSN: 0018-9383