Mixed Hot-Carrier/Bias Temperature Instability Degradation Regimes in Full { V G , V D } Bias Space: Implications and Peculiarities

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Authors: Markus Jech, Gunnar Rott, Hans Reisinger, Stanislav Tyaginov, Gerhard Rzepa, Alexander Grill, Dominic Jabs, Christoph Jungemann, Michael Waltl, Tibor Grasser

Journal title: IEEE Transactions on Electron Devices

Journal number: 67/8

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2020

Published pages: 3315-3322

DOI identifier: 10.1109/ted.2020.3000749

ISSN: 0018-9383