Distribution Function Based Simulations of Hot-Carrier Degradation in Nanowire FETs

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Authors: Michiel Vandemaele, Ben Kaczer, Zlatan Stanojevic, Stanislav Tyaginov, Alexander Makarov, Adrian Chasin, Hans Mertens, Dimitri Linten, Guido Groeseneken

Journal title: 2018 International Integrated Reliability Workshop (IIRW)

Journal publisher: IEEE

Published year: 2018

Published pages: 1-4

DOI identifier: 10.1109/iirw.2018.8727081

ISBN: 978-1-5386-6039-3