Understanding and Physical Modeling Superior Hot-Carrier Reliability of Ge pNWFETs

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: S. Tyaginov, A. Grill, A. De Keersgieter, G. Eneman, D. Linten, B. Kaczer, A.-M. El-Sayed, A. Makarov, A. Chasin, H. Arimura, M. Vandemaele, M. Jech, E. Capogreco, L. Witters

Journal title: 2019 IEEE International Electron Devices Meeting (IEDM)

Journal publisher: IEEE

Published year: 2019

Published pages: 21.3.1-21.3.4

DOI identifier: 10.1109/iedm19573.2019.8993644

ISBN: 978-1-7281-4032-2